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Direct Imaging of Microscopic Conductive Pathways Using a Modified Scanning Probe Microscope

Michael B. Heaney* and Ravi Viswanathan

This is an abstract for a poster to be presented at the Fifth Foresight Conference on Molecular Nanotechnology.

Disordered carbon-black/polymer composites form microscopic three-dimensional percolative electrical networks. These composites have widespread commercial applications. We have directly imaged the conductive network at the surface of these composites using an Electric Force Microscope. We can quantify the geometry of the conductive network to a resolution of 100 nm. This technique could be useful in the future construction of nanometer-scale electronic circuits.

References
[1] Phys. Rev. Lett. 75, 4433 (1995); 76, 3661(E) (1996).

*Corresponding Address:
Michael B. Heaney, Raychem Corporation MS 123-6343, 300 Constitution Drive, Menlo Park, CA 94025-1164. phone:650-361-2484, fax: 650-361-6405, E-mail: mheaney@raychem.com
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